STS8200 CROSS Series
STS8200 AXE-PLUS
Analog and Power Modules
Leading high-power semiconductor testing systems capable of testing MOSFETs, IGBTs, SiC, GaN, KGD, PIM, IPM modules, and wafer.
Comprehensive Parametric Measurement
Supports simultaneous testing of both static and dynamic parameters for IGBTs, MOSFETs, SiC, GaN, KGD, Wafer and other individual components and modules.
Soft and Hard Docking Capable
Integration of turret or pick-and-place handler via cables or hard-docking approach for reduced stray inductance on dynamic tests.
Enables user specific test flow and methods with open architecture C++ programming of test resources.
Key Features
- ±2000V/1000A (DC Static)
- 100kHz-1MHz ZMU (±40V DC Bias up to ±2000V option)
- Low leakage current range of ± 1nA
- Precision 18-bit voltmeter measurement
- IC resource digital capability
- 1200V/12000A dynamic test capabilities, hard or soft docking
Features system mainframe of 26 universal slots for Analog, Digital, PMIC and Power Modules test resources with full floating VI for high voltage and high current stacking capabilities. High power DC and dynamic resources are placed on the test head for hard docking and precision measurement as close to the device under test (“DUT”).
All AccoTEST test systems include comprehensive and no licence-based UI interface with full support for debug tools, waveform generation, and database generation tools with analytics.
