Analog and Power Test System
STS8200 CROSS Series
STS8200 PIM
Analog and Power Bricks
Leading high-power-delivery power semiconductor test system catering multi-bridges and power bricks modules for EV mobility and solar industries.
Hard Docking with Independent AC and DC Zones
One test head with two sockets or combined AC and DC for reduced test handler complexity and touchdown.
Analog Resources Integration
Flexibility of analog and digital capabilities to extend test methodologies and resource optimisations.
High Performance Waveform Capture and Data Acquisition
Built-in high bandwidth digitizer for dv/dt, di/dt and dynamics computation with 14-bits resolution for waveform capture.
Key Features
Maximum Voltage and Current Ratings:
- ±2000V/1000A (DC Static with 2000A option)
- 100kHz-1MHz ZMU (±40V DC Bias up to ±2000V option)
- Low leakage current range of ± 1nA
- Precision 18-bit voltmeter measurement
- IC resource digital capability
- 1200V/12000A dynamic test capabilities, hard or soft docking
Features system mainframe of 26 universal slots for Analog, Digital PMIC resources. Ultra high power DC and dynamic resources are located in the test head for optimum and precision test and measurement with high speed waveform capture capabilities.
All AccoTEST test systems include comprehensive and no licence-based UI interface with full support for debug tools, waveform generation, and database generation tools with analytics.
